Presentation Search * Program subject to change. Keyword Search Apply Day Title Tuesday Analysis of Nanosecond-Scale Temperature Sensing Technology for Flat-Top Nanosecond Green Laser Annealing Process of Semiconductor Si Wafers Tuesday Double-Pulse Laser Peening as a Surface Enhancement Technology Tuesday Comparative Study of Single-Beam and Dual-Beam Laser Annealing for Dopant Activation Process Tuesday Development of a Laser-based Process to Produce a Hermetically Sealed Contacting Interface for the Encapsulation of Temperature-sensitive Electronic Components Tuesday Surface Characterization of Surface Nanostructures Fabricated by Femtosecond Laser Pulses in GHz Burst Mode Tuesday Comparing Novel Chip Singulation Techniques for Silicon Carbide